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ABOUT INSTITUTE
STRUCTURE
RELATIONSHIP
REGULATIONS
SITE MAP
CONTACTS
Research
Development and projects
Patents
Production and service
Technology for producing polycrystalline silicon
Special equipment for semiconductor and metal production
Gallium arsenide (GaAs)
Indium arsenide (InAs)
Gallium antimonide (GaSb)
Indium antimonide (InSb)
Thallium and silver halogenides
Germanium
Cadmium-zinc-tellurium crystals (CdZnTe)
CdZnTe substrates
CdHgTe epitaxial layers
InGaAsP/InP and InGaAsSb/GaSb epitaxial layers
High purity compounds
High purity niobium
High-purity indium
High purity gallium
Rhenium
Nickel addition alloys
Titanium solder alloys
Magnetron sputtering targets
Water-activated chemical current sources
Rare metal nanopowders
Beneficiation of ores and manufactured raw materials
Designing of the enterprises
Complex project structure
List of works
Analysis and certification
Provided services
Equipment
Partners
Metrological Service
Director
Council of Young Scientists
Awards and diplomas
Regulations
Testimonials
Certificate on granting the status of SSC RF
Trademark
License to engage in activities constituting a state secret
Certificate of accreditation of analytical laboratories (centers)
Certificate of Accreditation of metrology service
